X‑ray Diffraction

The XRD facility is concerned with the characterisation of a wide array of solid-state materials. Details of our two diffractometers can be found here.

Staff

Contact: Dr. Rosa M. Danisi, rmd74@cam.ac.uk

Costs

University of Cambridge and OHEI users:

Data collection - 30 £/hour

Data Analysis - 50 £ / sample

Industry users:

Data collection - 60 £/hour (+ VAT where applicable)

Rietveld Refinement Analysis - 100 £ / sample (+ VAT where applicable)

Applications

Phase Identification

As the most widely used application of XRD, phase analysis aims to identify the phases present in a material by comparing measured diffraction patterns with those in the ICDD Powder Diffraction Database and the Crystallographic Open Database (COD).

Quantitative Phase Analysis using the Rietveld Method

Research indicates that the application of the Rietveld method to powder diffraction data yields the highest accuracy in quantitative phase analysis. This approach goes beyond full pattern fitting by refining the crystal structure of each individual phase, providing robust quantification and enabling the determination of percentage crystallinity using known standards.

Advanced Methodology

We also offer crystallite size determination by XRD, lattice parameter determination and crystal structure solution using the Rietveld method.

Training

We provide customised training in XRD data collection and analysis, as well as yearly multiple-day Rietveld analysis workshops.