The XRD facility is concerned with the characterisation of a wide array of solid-state materials. Details of our two diffractometers can be found here.
Staff
Contact: Dr. Rosa M. Danisi, rmd74@cam.ac.uk
Costs
University of Cambridge and OHEI users:
Data collection - 30 £/hour
Data Analysis - 50 £ / sample
Industry users:
Data collection - 60 £/hour (+ VAT where applicable)
Rietveld Refinement Analysis - 100 £ / sample (+ VAT where applicable)
Applications
Phase Identification
As the most widely used application of XRD, phase analysis aims to identify the phases present in a material by comparing measured diffraction patterns with those in the ICDD Powder Diffraction Database and the Crystallographic Open Database (COD).
Quantitative Phase Analysis using the Rietveld Method
Research indicates that the application of the Rietveld method to powder diffraction data yields the highest accuracy in quantitative phase analysis. This approach goes beyond full pattern fitting by refining the crystal structure of each individual phase, providing robust quantification and enabling the determination of percentage crystallinity using known standards.
Advanced Methodology
We also offer crystallite size determination by XRD, lattice parameter determination and crystal structure solution using the Rietveld method.
Training
We provide customised training in XRD data collection and analysis, as well as yearly multiple-day Rietveld analysis workshops.